Overview

SCL-Sensortech focuses on the improvement of next generation atomic force microscopy (AFM) cantilevers. Especially small and piezo-resistive self-sensing cantilevers for laser-free SPM imaging. The cantilevers are suited for use in non-contact and contact AFM imaging modes. The laser-free operation mode and a free space above a cantilever opens many doors for complete new AFM and cantilever based sensing applications (e.g. for AFM insitu a SEM – see the AFSEM(R) product from GETec Microscopy).