Vladimir Mikhailovskii

Senior Researcher at Санкт-Петербургский Государственный Университет
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Contact Information
us****@****om
(386) 825-5501
Location
DE

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Credentials

  • Electron CrossBeam Microscope
    ZEISS Microscopy

Experience

    • Russian Federation
    • Higher Education
    • 200 - 300 Employee
    • Senior Researcher
      • Feb 2015 - Present

      Scanning Electron Microscopy(SEM) and Focused Ion Beam(FIB) investigations, electron and ion beam lithography, sample preparation, customer consulting, laboratory users training

    • Researcher
      • Feb 2011 - Feb 2015

      SEM and FIB investigations, sample preparation, routine laboratory maintaining, customer consulting.

Education

  • Санкт-Петербургский Государственный Университет
    Master of Physics, Physics of Semiconductors
    2009 - 2012
  • Санкт-Петербургский Государственный Университет
    Bachelor of Physics, Physics of Semiconductors
    2005 - 2009

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