Jordan Yan

Sr. Process Engineer at ECI Technology, Inc
  • Claim this Profile
Contact Information
us****@****om
(386) 825-5501
Location
JE
Languages
  • English Professional working proficiency
  • Chinese Native or bilingual proficiency
Skills

Topline Score

Bio

Generated by
Topline AI

0

/5.0
/ Based on 0 ratings
  • (0)
  • (0)
  • (0)
  • (0)
  • (0)

Filter reviews by:

No reviews to display There are currently no reviews available.

0

/5.0
/ Based on 0 ratings
  • (0)
  • (0)
  • (0)
  • (0)
  • (0)

Filter reviews by:

No reviews to display There are currently no reviews available.
You need to have a working account to view this content. Click here to join now

Experience

  • ECI Technology, Inc
    • United States
    • Semiconductor Manufacturing
    • 1 - 100 Employee
    • Sr. Process Engineer
      • Jan 2015 - Present
  • Enthone
    • Germany
    • Business Consulting and Services
    • Research Scientist
      • 2010 - 2014

      Copper damascene additive development for 22 & 14nm node Copper damascene additive development for 22 & 14nm node

  • US Chrome
    • United States
    • Accounting
    • 1 - 100 Employee
    • Product Development Scientist
      • 2009 - 2010

      Co-P-SiC based coating for chrome replacement Ni-Co-P coating for corrosion and wear resistance Co-P-SiC based coating for chrome replacement Ni-Co-P coating for corrosion and wear resistance

  • ATMI
    • United States
    • Semiconductor Manufacturing
    • 1 - 100 Employee
    • Research Scientist
      • May 2007 - 2009

      Post CMP cleaner for 45nm and beyond Post CMP cleaner for 45nm and beyond

  • Nano-Tex
    • Sweden
    • Textile Manufacturing
    • 1 - 100 Employee
    • Scientist
      • 2005 - 2007

      Modification of fabric with nano material for special function such as odor control Modification of fabric with nano material for special function such as odor control

Education

  • Louisiana Tech University
    Ph. D. in Engineering, MEMS
    2001 - 2005

Community

You need to have a working account to view this content. Click here to join now