Experience

Eurofins | EAG Laboratories

• United States
• Research
• 400 - 500 Employee

• Senior Scientist - Dynamic SIMS and Material Characterization

  • Sep 2015 - Present

  Materials Characterization expert in the area of surface analysis, electronic materials, and physics and chemistry at the nanoscale.

• Senior Scientist - Microscopy & Microanalysis

  • Oct 2005 - Present

  Expert and customer contact for analytical problems requiring microscopy including: SEM, focused ion beam microscopy (FIB), FIB cross section techniques, transmission electron microscopy (TEM/STEM), SPM, and optical microscopy. Supporting contact for Auger electron spectroscopy (AES), X-ray photo electron spectroscopy (XPS/ESCA), and time of flight secondary ion mass spectrometry (TOF-SIMS).

• Senior Scientist

  • Jul 2005 - Present

  My responsibilities include materials characterization, documentation and publication. I am also a primary contact for clients in the areas of microscopy (including AFM, SEM, TEM, and FIB), microanalysis (including EDS, AES, XPS/ESCA, and TOF-SIMS), and dynamic SIMS.



University of Pennsylvania

• United States
• Higher Education
• 700 & Above Employee

• scientist

  • Aug 2000 - Oct 2005

  Staff scientist in the department of Materials Science & Engineering [MCF, LRSM, PRN, CENS]. Research areas AFM, SPM, SEM-EDS, surface analysis, & nanotechnology. Staff scientist in the department of Materials Science & Engineering [MCF, LRSM, PRN, CENS]. Research areas AFM, SPM, SEM-EDS, surface analysis, & nanotechnology.