Guoqiang Fan

PIE at Galaxycore Inc
  • Claim this Profile
Contact Information
us****@****om
(386) 825-5501
Location
Pudong, Shanghai, China, CN

Topline Score

Topline score feature will be out soon.

Bio

Generated by
Topline AI

You need to have a working account to view this content.
You need to have a working account to view this content.

Experience

    • China
    • Semiconductor Manufacturing
    • 1 - 100 Employee
    • PIE
      • Aug 2021 - Present

      CIS process development/transfer, system setup CIS process development/transfer, system setup

    • Taiwan
    • Semiconductors
    • 700 & Above Employee
    • PIE
      • Mar 2021 - Jul 2021

      55eHV DDI/TDDI yield improvement/process optimisation 55eHV DDI/TDDI yield improvement/process optimisation

    • United States
    • Semiconductor Manufacturing
    • 700 & Above Employee
    • PIE
      • Nov 2015 - Mar 2021

      In charge of 40LP, 65nm LP/LPE, RFSOI consumer and automotive products, familiar with new product tapeout, product control, ramping, yield improvement, FMEA, PCP, 8D, SPC, Lean 6sigma control, customer management 1-Inline and WAT Cp/Cpk improvement 2-Process control, new tape out, testkey design and testing, automotive new product safe launch 3-CIP to improve product yield 4-Investigation and report for Low yield and excursion case 5-Process conversion for cost saving In charge of 40LP, 65nm LP/LPE, RFSOI consumer and automotive products, familiar with new product tapeout, product control, ramping, yield improvement, FMEA, PCP, 8D, SPC, Lean 6sigma control, customer management 1-Inline and WAT Cp/Cpk improvement 2-Process control, new tape out, testkey design and testing, automotive new product safe launch 3-CIP to improve product yield 4-Investigation and report for Low yield and excursion case 5-Process conversion for cost saving

    • China
    • Semiconductor Manufacturing
    • 700 & Above Employee
    • Yield Engineer
      • Sep 2013 - Nov 2015

Education

  • Soochow University (CN)
    Master's degree, Materials Science
    2006 - 2013

Community

You need to have a working account to view this content. Click here to join now