Experience

uSens Energy Solutions

• Türkiye
• Business Consulting and Services
• 1 - 100 Employee

• Data Analyst

  • Aug 2022 - Present

  Micrositing and Energy Yield Assessment for Wind PPP. Micrositing and Energy Yield Assessment for Wind PPP.



Fraunhofer-Institut für Solare Energiesysteme ISE

• Germany
• Research
• 700 & Above Employee

• Graduate Research Assistant

  • May 2021 - Oct 2021

  • Carried research on kerf-less silicon manufacturing technique, epitaxy.• Conducted experiments operating chemical vapour deposition reactor for epitaxial growth of silicon.• Implementation and analysis of solar cell characterization methods (QSSPC, SAM).• Semi-automatic defect counting of crystal defects and improvement of particle analysis software.

• Master Thesis Project

  • Sep 2020 - Apr 2021

  •Literature research on epitaxial growth of silicon and material quality improvement. Crystal defects in EpiWafers, and their impact on minority carrier lifetime. Related measurement methods.• Planning, implementation and evaluation of experiments in the silicon epitaxial reactor. • Independent operation of the chemical vapour deposition reactor for epitaxial growth of silicon.• Implementation and evaluation of lifetime measurements (QSSPC).• Planning of experiments to improve defect etching which was carried out in cooperation with a chemical lab.• Semi-automatic counting of crystal defects with the help of an optical microscope including improvement of the program for detecting defect classes (stacking faults, dislocations). • Regular presentation of the progress of the work at weekly group meetings.• Responsible for carrying out an experiment for quantification of contamination level in the chemical vapour deposition reactor.

• Scientific Assistant

  • Jan 2019 - Oct 2020

  • Implementation of solar cell characterization methods such as AFM, SAM, semi-automatic crystal defect counting.• Data-base improvement particle analySIS software for detection, categorization, mapping, and semi-automatic counting of crystal defects propagated in EpiWafers.• Responsible for data analysis, PLI analysis, resistivity calculation and preparation of maps.