Sr. Mechatronics Research Engineer

• Sep 2023 - Present

Mechatronics Engineer

• Apr 2022 - Sep 2023

Working on one of the most complicated mechatronics systems on the planet. As dynamics and control specialist for EUV systems, I am responsible for mechatronics design and integration of projection optics of extreme ultraviolet light.

Design Engineer: On Product Overlay Control

• Feb 2019 - Apr 2022

I am responsible for functional (algorithm) design/requirements/validations of technical software for overlay control in fab automation and high volume manufacturing.

Research Scientist (Dynamics and Control Specialist)

• Jul 2017 - Feb 2019

In TNO, I have been working on developing high-tech instruments for imaging, inspection, metrology, and lithography at nano-scale. Particularly, my job was to come up with new solutions, concepts, methods or designs to meet the ever-increasing requirements of the semiconductor industry with alternative opto-mechatronic tools.

Guest Researcher

• Apr 2013 - Jun 2017

PHD Candidate

• Apr 2013 - Jul 2017

In my PhD project, I studied the dynamics of Tapping Mode Atomic Force Microscopy (AFM) and came up with new solutions to improve its speed, accuracy, and reliability. The overall goal of this project was to contribute to development of the AFM towards a clinical and industrial tool. When things are smaller than the wavelength of visible light (few 100s of nm), it 's hard to see them (if not impossible). Yet, One can still touch and feel them using an AFM. The Atomic Force… Show more In my PhD project, I studied the dynamics of Tapping Mode Atomic Force Microscopy (AFM) and came up with new solutions to improve its speed, accuracy, and reliability. The overall goal of this project was to contribute to development of the AFM towards a clinical and industrial tool. When things are smaller than the wavelength of visible light (few 100s of nm), it 's hard to see them (if not impossible). Yet, One can still touch and feel them using an AFM. The Atomic Force Microscope is a scanning probe microscope that utilizes an atomically sharp tip and a cantilever (probe) to feel the surface when details are much smaller than the diffraction limit of the light. AFMs have proven their abilities in the measurement of materials with one atom precision, yet the speed of such systems are very limited. In my Ph.D. project, I aim to increase the imaging speed and throughput of AFMs by first: Introducing new probes, and control algorithms, and second: enabling its massive parallelization. To achieve these requirements, the architecture of the AFM had to be redesigned or reorganized to initially ensure a fast, non-destructive, and accurate imaging. The outcome of this project allows simultaneous topography imaging, material properties mapping and even manipulating the samples with nanometer resolution and in a relatively short time. Show less In my PhD project, I studied the dynamics of Tapping Mode Atomic Force Microscopy (AFM) and came up with new solutions to improve its speed, accuracy, and reliability. The overall goal of this project was to contribute to development of the AFM towards a clinical and industrial tool. When things are smaller than the wavelength of visible light (few 100s of nm), it 's hard to see them (if not impossible). Yet, One can still touch and feel them using an AFM. The Atomic Force… Show more In my PhD project, I studied the dynamics of Tapping Mode Atomic Force Microscopy (AFM) and came up with new solutions to improve its speed, accuracy, and reliability. The overall goal of this project was to contribute to development of the AFM towards a clinical and industrial tool. When things are smaller than the wavelength of visible light (few 100s of nm), it 's hard to see them (if not impossible). Yet, One can still touch and feel them using an AFM. The Atomic Force Microscope is a scanning probe microscope that utilizes an atomically sharp tip and a cantilever (probe) to feel the surface when details are much smaller than the diffraction limit of the light. AFMs have proven their abilities in the measurement of materials with one atom precision, yet the speed of such systems are very limited. In my Ph.D. project, I aim to increase the imaging speed and throughput of AFMs by first: Introducing new probes, and control algorithms, and second: enabling its massive parallelization. To achieve these requirements, the architecture of the AFM had to be redesigned or reorganized to initially ensure a fast, non-destructive, and accurate imaging. The outcome of this project allows simultaneous topography imaging, material properties mapping and even manipulating the samples with nanometer resolution and in a relatively short time. Show less