Experience

Digma Medical

• Israel
• Medical Equipment Manufacturing
• 1 - 100 Employee

• Sr. Physicist

  • Jun 2019 - Present

  Israel



Ormat Technologies, Inc.

• United States
• Industrial Machinery Manufacturing
• 700 & Above Employee

• Battery/Energy Storage System Development

  • Aug 2018 - Jan 2019

  Yavne, Israel Search and evaluation of new battery and energy storage technologies, battery testing methods and facilities, battery and Energy Storage System (ESS) manufacturers. Lots of self-learning



Sandisk / Western Digital

• Senior Failure Analysis Engineer

  • Jan 2018 - Jul 2018

  Omer, Israel Failure analysis / Competitive analysis: o Analysis and evaluation of the new SSD and mobile memory controllers technology, architecture, design, integration. Intensive information search and self-learning o Development of new methods for reflow tests, decapsulation, rewiring/connection, polished die thickness control, circuit editing, etc. o FA of semiconductor devices – Si ASIC dies, substrates and packaging: Optical Inspection, incl. IR, OBIRCh;… Show more Failure analysis / Competitive analysis: o Analysis and evaluation of the new SSD and mobile memory controllers technology, architecture, design, integration. Intensive information search and self-learning o Development of new methods for reflow tests, decapsulation, rewiring/connection, polished die thickness control, circuit editing, etc. o FA of semiconductor devices – Si ASIC dies, substrates and packaging: Optical Inspection, incl. IR, OBIRCh; Decapsulation, Polishing, Micromachinery, C-SAM, X-ray and microCT, HR SEM, ESD, FIB, TEM Show less



SanDisk, a Western Digital brand

• Failure Analysis Engineer

  • Jan 2017 - Jan 2018

  Omer, Israel



SanDisk

• Failure Analysis Engineer

  • Oct 2015 - Jan 2017

  Omer, Israel



Nanonics Imaging Ltd

• Nanotechnology Research
• 1 - 100 Employee

• Consultant, Physicist, NPI Project Leader

  • Dec 2013 - Mar 2015

  Jerusalem - Development of new AFM (Atomic Force Microscopy) applications, based on the existing modules and products in order to optimize the product cost and get an essential added market value: - Kelvin Probe Force Microscopy (KPFM) application utilizing quartz tuning fork, - New probes and applications for pA currents measurements, surface potential and contact potential / work function measurements at micro- and nano-scale metal-semiconductor structures and… Show more - Development of new AFM (Atomic Force Microscopy) applications, based on the existing modules and products in order to optimize the product cost and get an essential added market value: - Kelvin Probe Force Microscopy (KPFM) application utilizing quartz tuning fork, - New probes and applications for pA currents measurements, surface potential and contact potential / work function measurements at micro- and nano-scale metal-semiconductor structures and living cells Show less



Global Research and Adv. Development, CT/AMI Engineering R&D, Philips HC

• Researcher, X-ray Detection and Spectral CT Lab

  • May 2010 - Jan 2013

  Haifa, Israel Physicist, Spectral CT and Detection Lab, Haifa GRAD (Global Research and Advanced Development), CT/AMI Engineering R&D Philips Healthcare, [Philips Medical Systems Technologies Haifa, Israel] Development of a new generation of X-ray detectors for energy resolving detection [Photon Counting] of high flux radiation used in CT (computed tomography) scanners - Room Temperature Semiconductor Detectors (RTSD) for X-ray detection / Photon counting. Development, characterization… Show more Physicist, Spectral CT and Detection Lab, Haifa GRAD (Global Research and Advanced Development), CT/AMI Engineering R&D Philips Healthcare, [Philips Medical Systems Technologies Haifa, Israel] Development of a new generation of X-ray detectors for energy resolving detection [Photon Counting] of high flux radiation used in CT (computed tomography) scanners - Room Temperature Semiconductor Detectors (RTSD) for X-ray detection / Photon counting. Development, characterization, inspection and testing of detector materials and assembly, reading electronics and SW: crystal quality, metallization and coating layers; electrical characterization and testing, X-ray characterization, IR inspection, Pockels effect measurements, etc. - Development of a new method for the optical stimulation of high flux detectors, a new detector electrodes configuration, method and equipment for temporary detector assembly and soft crystal probing - Most of the work conducted in cooperation with other Global Research groups and external vendors Show less



The Center for Nanoscience and Nanotechnology, Tel-Aviv University

• Researcher

  • Oct 2007 - Apr 2010

  Nanoscale electrical characterization of semiconductor devices, structures and materials using AFM-based applications, HR SEM, etc. Design of Experiment, Multidisciplinary Systems design and Applications development: equipment selection, development/adjustment and configuration; image processing and data analysis UHV systems for materials characterization at cryogenic and elevated temperatures

• Researcher/PhD student/Postdoc

  • Mar 2002 - Apr 2010

  Surface defect metrology and characterization, Systems and techniques for nanoscale electrical characterization of semiconductor materials, structures and devices: - SPM (Scanning Probe Microscopy) - AFM and AFM-based applications, AFP, STM - Work Function and Contact Potential measurements, Nanoscale Surface Potential mapping - Charge trapping in FIB and secondary electron contrast in SEM Development and characterization of semiconductor devices and structures: -… Show more Surface defect metrology and characterization, Systems and techniques for nanoscale electrical characterization of semiconductor materials, structures and devices: - SPM (Scanning Probe Microscopy) - AFM and AFM-based applications, AFP, STM - Work Function and Contact Potential measurements, Nanoscale Surface Potential mapping - Charge trapping in FIB and secondary electron contrast in SEM Development and characterization of semiconductor devices and structures: - Characterization of surface state densities, surface charge and surface band bending - High-k/metal gate stacks, gate oxide defects and charge trapping - Charge trapping in non-volatile memory devices (NVMD) - Bio-sensing FETs and organic thin film transistors (TFT)



Tower Semiconductors

• Israel
• Semiconductor Manufacturing
• 700 & Above Employee

• PhD Student at TAU, Joint project on ONO NVMD devices characterization

  • 2002 - 2003

  Nanoscale characterization of trapped charge trapping inside the structures. Cross-sectional cleave preparation of multi-layer MOS capacitor before and after charge injection and KPFM (Kelvin Probe Force Microscopy - AFM-based technique for surface potential/contact potential/work function measurements with nanoscale resolution)