Overview

This laboratory offers the possibility to explore structural properties of samples by X-Ray Diffraction characterization technique. The available techniques are: 1) High-Temperature XRD(upto1600°C) 2) Grazing Incidence 3) Small Angle X-Ray Scattering (SAXS) 4) X-Ray Reflectivity (XRR) 5) Low Angle XRD 6) Phase identification/ Quantification 7) Structure Refinement 8) Microstructure 9) Indexing 10) Fiber Orientation